Features
LORESTA-GX has a expanded measuring range of 10-4~107 Ω. The probe enables one-touch direct reading of [Ω], [Ω/sq.], and [Ω∙cm]. It has a special silicon mode for silicon wafer measurement and one-touch automatic measurement by new functions like Auto-Hold and Timer Mode. The accurate low resistivity meter based on 4 Terminal 4 Pin method. It ensures a high accuracy by MCP probes’ spring contact method which keeps pin pitch, pressure and contact area on samples constant.
UsesR&D, Production Engineering, Quality Control
According to ASTM D 991 / ISO 2878 / ISO 1853 /
JIS K 7194 / JIS R 1637
Applications
- Paints, pastes, paints, printing ink
- Plastics, rubber
- metallic thin films, metallised films
- amorphous silicon / silicon wafer
- antistatic materials
- EMC shielding materials
- ITO glass, coated glass
- passivated metals
- magnesium alloys
- Coated sheet metal, steel, aluminum • etc.
Specifications
| Measuring Method | 4-pin probe, constant-current method |
| Measuring mode | Auto-Function : Auto-hold / Time Mode - Special Silicon Measuring Mode |
| Display | 7.5" TFT LC-Touch Display, 640 x 480 Pixel |
| Power Supply | AC 85-264 V / 47-63 Hz / 40 VA |
| Interface of Data Output | USB |
| Dimensions | 320mm x 285mm x 110mm |
| Weight | 2.4 kg |
| Standard Accessories | ASP Probe RMH110 (4-pin, inter-pin distance 5mm, pin-head radius 0.37mm) Probe Checker RMH304 (1.0 Ω) |